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ELDIM at Electronic Imaging 2010
Dr. Pierre BOHER, R&D application head Manager, will be present at the San Jose (USA) SPIE, Electronic Imaging 2010 conference as invited speaker...
Dr. Pierre BOHER, R&D application head Manager, will present :
Session 7: Stereoscopic Image Quality and Metrics
Date: Tuesday 19 January
Time: 3:40 PM - 5:20 PM
Time: 3:40 PM - 5:20 PM
Multispectral polarization viewing angle analysis of circular polarized stereoscopic 3D displays
Paper 7524-26Time: 4:00 PM - 4:20 PM
Author(s): Pierre M. Boher, Thierry R. Leroux, Thibault Bignon, Véronique Collomb-Patton, ELDIM (France)
Posters Session
Date: Tuesday 19 January
Time: 5:30 PM - 7:00 PM
Time: 5:30 PM - 7:00 PM
Imaging polarization for characterization of polarized based 3D displays and 3D projectors
Paper 7524-57Author(s): Pierre M. Boher, Thierry R. Leroux, Véronique Collomb-Patton, Thibault Bignon, David Glinel, ELDIM (France)
Newsletter March 2010
