ELDIM at IDW'08 with spectral characterization conference

ELDIM's R&D Application Manager, Dr. Pierre BOHER will present a conference at Niigata (Japan) IDW'08 conference.

Dr. Pierre Boher, ELDIM's R&D Application Manager, will present a conference in the FPD Manufacturing, Materials and Components workshop Wednesday the 3rd of december, room 301 at 17:00. "viewing angle and spectral characterization of LCDs and their components A new Fourier optics system capable to measure spectral information at each incidence and azimuth angles is presented. In reasonable measurement times, a full viewing angle pattern of radiance at 31 wavelengths regularly distributed in the visible range is obtained. Full polarization analysis of the light at each wavelength is possible. Paper focuses on grey level and polarization analyses of one LCD display in order to show some of the possibilities of the new instrument." For more information on IDW'08: http://www.idw.ne.jp