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ELDIM at SID'08 symposium

Session Display measurement poster, thursday may 22, 4:00 PM to 7:00 PM, Exhibit hall B

ELDIM at SID'08 symposium

P.89 - New Multispectral Fourier-Optics Viewing-Angle Instrument for Full Characterization of LCDs and Their Components

Pierre Boher, Thierry Leroux, Thibault Bignon, David Glinel

This paper describes an advancement in high speed Fourier optics photometry to render multi-spectral data in a comparable timeframe to traditional luminance and tri-stimulus colorimeters.  System architecture and performance benchmarks are described along with target application information.
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