A common approach to characterizing autostereoscopic and polarization-based 3-D displays

For JSID 18.4.2010

Authors: P. BOHER, T. LEROUX, T. BIGNON, D. GLINEL and V. COLLOMB-PATTON

Multispectral polarization analysis of circular polarizer stereoscopic 3D display

For IDW'09

Authors: P. BOHER, T. LEROUX, T. BIGNON and V. COLLOMB-PATTON

Polarization imaging for characterization of LCDs and their components

For IDW'09

Authors: P. BOHER, T. LEROUX, V. COLLOMB-PATTON, T. BIGNON and D. GLINEL

Polarized based stereoscopic 3D display characterization using Fourier optics instrument and computation in the observer space

For IDW'09

Authors: P. BOHER, T. LEROUX, V. COLLOMB-PATTON and T. BIGNON 

Characterization of auto-stereoscopic and polarization based on 3D displays: a common approach

For IMID'09

Authors: P. BOHER, T. LEROUX, V. COLLOMB-PATTON and T. BIGNON

New generation of imaging colorimeter and imaging polarimeter

For IMID'09

Authors: P. BOHER, T. LEROUX, and D. GLINEL

Polarization based stereoscopic display characterization

For ASID'09

Authors: P. BOHER, T. LEROUX, V. COLLOMB-PATTON and T. BIGNON

Polarization imaging for characterization of LCDs and their components

For Eurodisplay 09

Authors: P. BOHER, T. LEROUX, and D. GLINEL

Characterization of autostereoscopic 3D displays using Fourier optics instrument

For IDMC'09

Authors: P. BOHER, T. LEROUX, V. COLLOMB-PATTON, T. BIGNON and D. GLINEL

SID'09 Distinguished paper

VCMaster3D: a new Fourier optics viewing angle instrument for characterization of autostereoscopic 3D displays

For SID09

Authors: P. BOHER, T. LEROUX, T. BIGNON, D. GLINEL and Shin ichi UEHARA (NEC)

Comprehensive survey on viewing angle measurement devices: a theoretical study

For SID09

Authors: V. COLLOMB-PATTON, P. BOHER, T. LEROUX

Characterization of polarization based stereoscopic 3D displays using viewing angle and homogeneity measurements

For SID09

Authors: P. BOHER, T. LEROUX, T. BIGNON, V. COLLOMB-PATTON

A new way to characterize auto-stereoscopic 3D displays using fourier optics instrument

For stereoscopic Displays and Applications

Authors: P. BOHER, T. LEROUX, T. BIGNON, V. COLLOMB-PATTON

Color calibration for specific sources versus a reference instrument

Author: P. BOHER

Viewing Angle and spectral characterization of LCDs and their components

For SID 2008

Authors: P. BOHER, T. BIGNON, D. GLINEL, T. LEROUX

Angle of view polarization characterization of LCDs

For IMID 2007

Authors : P. BOHER, T. LEROUX, T. BIGNON

Temporal behavior of LCDs: Relationship between Gray to Gray Response Time and Moving Picture Response Time

For SID 2007

Authors : P. BOHER, D. GLINEL, T. LEROUX, T. BIGNON and J.N. CURT

Angle of view measurements of reflective displays with fourier optics based instruments

For ADEAC 2006

Authors : T. LEROUX, T. BIGNON, P. BOHER

Precise response time measurement and analysis of liquid crystal displays

For IMID/IDMC 2006

Authors : T. LEROUX, D. GLINEL, P. BOHER

Calibration of a fourier optics based measurement system

For SID 2006

Authors : T. LEROUX, T. BIGNON, P. BOHER, E. CHAUVAT

Requirements in terms of measurement area for viewing angle optical characterization of liquid crystal displays

For IMID 2005

Authors : T. LEROUX, T. BIGNON, P. BOHER

Image sticking cartography on PDP TV: a new quantitative measurement

For SID 2005

Authors : T. BIGNON, V. GIBOUR, P. BOHER, T. LEROUX

Robustness of automated mura inspection versus measurement conditions

For IDMC 2005

Authors : V. GIBOUR, P. BOHER, T. LEROUX, J. GUO, B. HUANG, K. WANG, C. CHEN

CCFL backlight characterization using luminance meter and image analysis

For ADEAC 2004

Authors : V. GIBOUR, P. BOHER, T. LEROUX

Uniformity calibration of large area full color light emitted diode screens

For ADEAC 2004

Authors : V. GIBOUR, P. BOHER, T. LEROUX

New generation of viewing angle measurement system and automated cartography of large size flat panel displays

For ADEAC 2004

Authors : V. GIBOUR, P. BOHER, T. LEROUX

Innovative rapid photo-goniometry method for CD metrology

For Microlithography 2004

Authors : M. LUET, P. BOHER, T. LEROUX, J. PETIT, P. BARRITAULT, J. HAZART, P. CHATON

A new analysis strategy for CD metrology using rapid photo-goniometry method

For Microlithography 2004

Authors : M. LUET, P. BOHER, T. LEROUX, J. PETIT, P. BARRITAULT, J. HAZART, P. CHATON

Optical fourier transform scatterometry for LER and LWR metrology

Authors : P. BOHER, T. LEROUX, J. PETIT, J. FOUCHER, Y. DESIERES, J. HAZART, P. CHATON

Improved CD and overlay metrology using an optical fourier transform instrument

Authors : P. BOHER, T. LEROUX, J. PETIT, P. BARRITAULT, J. HAZART, P. CHATON

Light scattered measurements using fourier optics: a new tool for surface characterization

For Photonics Europe 2004

Authors : M. LUET, P. BOHER, T. LEROUX

Imaging polarization interferometer for flat panel display characterization

For SID 2004

Authors : M. LUET, P. BOHER, T. LEROUX

ELDIM method versus crystal rotation method

Author: T. LEROUX

AX120R Lite system to get fast and efficient evaluation of small LCD's panel

Author: T. LEROUX

Polarization measurement with EZContrast

Author: T. LEROUX

Contrast and colorimetry measurements versus viewing angle for microdisplays

Authors: T. LEROUX, J.N. CURT, O. MOREAU

 Index of refraction from reflexion coefficient measurement with EZContrast

Authors: T. LEROUX, M. LUET