News

Newsletter january 2010

 

ELDIM at Electronic Imaging 2010

Dr. Pierre BOHER, R&D application head Manager, will be present at the San Jose (USA) SPIE, Electronic Imaging 2010 conference as invited speaker...

ELDIM at CIE 2010

Dr. Pierre BOHER, R&D application head Manager, will present a technical papers at CIE 2010 "lighting quality & energy efficiency" in Vienna (Austria) from march 14 to 17 2010...

Newsletter November 2009

 

Newsletter October 2009

 

Newsletter july 2009

 

Newsletter June 2009

 

ELDIM at IDW 2009

Dr. Pierre BOHER, R&D application head Manager, will present 2 technical papers and a poster at IDW 2009 in Miyazaki (Japan) from december 9 to 11 2009...

ELDIM at IMID 2009

Dr. Pierre BOHER, R&D application head Manager, will be present at the Seoul (Korea) IMID 2009 exhibition with Thierry LEROUX, ELDIM's CEO as invited speaker...

Distinguished Paper Award at SID'09

Dr. Thierry LEROUX, CEO, Dr. Pierre BOHER, R&D application head Manager and their team winned an award for their paper: VCMaster3D: a new Fourier optics viewing angle instrument for characterization of autostereoscopic 3D displays...

Newsletter May 2009

Video photometer & colorimeter: the next generation...

Newsletter march 2009

All you need to know about EZContrastMS and Multispectral measurement in the entire viewing angle...

ELDIM at San Antonio Display Week'09

Dr. Pierre BOHER, R&D application head Manager, will present a paper about 3D displays characterization...

Dr. Pierre BOHER chairman at IDW'08

Dr. Pierre BOHER, ELDIM's R&D Application Manager, will be chairman at Niigata, IDW'08 conference.

ELDIM at IDW'08 with spectral characterization conference

ELDIM's R&D Application Manager, Dr. Pierre BOHER will present a conference at Niigata (Japan) IDW'08 conference.

ELDIM at IDW'08 With 3D displays conference

ELDIM's R&D application manager, Dr. Pierre Boher will present a conference about 3D Displays at Niigata IDW'08.

ELDIM in Summer issue of Display Devices Magazine

In the summer issue of Display Devices Magazine, ELDIM propose an article on luminance and color measurement inside pixels with new MVP (Micro Video Photometer).

ELDIM at SID'08 symposium

Session Display measurement poster, thursday may 22, 4:00 PM to 7:00 PM, Exhibit hall B

ELDIM at SID'08 exhibitor forum

ELDIM's presentation will be held THURSDAY, MAY 22, WEST EXHIBIT HALL B, Session 6: Display Metrology (9:00-10:30 am).

ELDIM at SID'08

You want to see our brand new 3D display measurement equipment and our latest products ? Meet us at SID'08, booth #535

3D displays characterization and analysis by ELDIM

ELDIM manufactures a brand new product for autostereoscopic 3D displays characterization. The new EZLite 3D provides many measurements versus angle as 3D Crosstalk, Optimum viewing distance, Viewing freedom and many more...

ELDIM: exclusive distributor for OTSUKA MPRT system

ELDIM distributes OTSUKA portfolio of MPRT Systems and dedicated equipments for Imaging applications. ELDIM supports its customers by providing technical services.

ELDIM's presentation awarded at IMID'07

At IMID'07 in Korea, ELDIM's won an "outstanding paper award" for it's "Viewing angle LCD polarization characterization" poster.

ELDIM's presentation at SPIE European Symposium on Optical Metrology

On behalf of the chairs for the conference on “Optics for Arts, Architecture, and Archaeology” ELDIM will presente “Cost effective spectral imager for work of art characterization.” This conference is part of the SPIE European Symposium on Optical Metrology which will be held 18 through 22 June 2007 at the International Congress Ctr., Munich, Germany, in co-location with the Laser World of Photonics Congress.