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Newsletter October 2009


Multispectral imaging systems generate different images of the same object at different wavelengths. Compare to color imaging this technique is much more powerful avoiding metamerism problems and analyzing in depth the light emission properties of any object. Until now, this technology has been limited to select military, medical and scientific applications. Indeed, absolute measurements are quite difficult to obtain using most of these techniques. We present here a system that allows absolute multispectral measurements in the visible range with excellent accuracy.


 

UMaster-MS description
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 High accuracy: high grade optics & telecentric objectives on the sensor side (no need for different calibration depending on distance)
 High Sensitivity: true 16 bits peltier cooled CCD (very high resolution & excellent in very low luminance level)
 High dynamic: additionnal ND available for very bright sources
 High wavelength resolution: very high quality of pass band filter

 

Data analysis & software

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UMaster provides a number of tools to analyze completely the multispectral measurements. Luminance and color maps can be computed easily. Spectral information at any position on the image can be extracted and average on small zones is possible. Dedicated algorithms for display analysis are available such as contour extraction, Moiré removal and LED detection and integration. The captured images can be immediately analyzed with comprehensive, integrated graphs, charts and spreadsheets for:

 

• Radiance
• Luminance
• Color
• Illuminance
• Luminous Intensity
• Total Luminous Flux
• Irradiance
• Radiant Intensity
• Total Radiant Flux
• CIE Chromaticity Coordinates (x,y , u’,v‘ and a,b)
• Correlated Color Temperature (CCT)
 Contrast ratio

Data and graphs can be easily exported to other Windows applications with Microsoft ActiveX technology interface.

 

Contacts
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Since 1991, ELDIM is worldwide leader in innovative solutions for fast and accurate characterization of all kind of projection and direct view displays and their components (films, LED, etc...). These leading edge instruments greatly streamline your development and quality control.

Feel free to contact ELDIM for detailed UMaster-MS information or please forward this newsletter to people may be concerned with.