Accurate angular and spatial emission properties of light sources is needed to qualify and predict the performances of any lighting system. ELDIM is pleased to present its new ECMaster Fourier optics source analyzer that allows rapid light source characterization along thousands of angular directions with ultrahigh angular resolution. Fourier optics has the capacity to transform the angular response of a sample in spatial information that can be imaged by a 2D sensor . The angular emission is then measured simply and quickly without any mechanical movement with a very high angular resolution. Thanks to its great experience in the field of display metrology, ELDIM is proud to propose a new instrument, that measures the light distribution of one virtual small emission spot in quasi all the hemisphere within seconds. A simple XY stage moving the light source in front of the system is then used to map a surface adapted to the size of the source with this virtual emission spot. Detailed near field and far field color and luminance emission are deduced and converted to ray sets for optical design. The method can be applied to any type of light source and can be used in a compact laboratory space even if the source is very large. The simplicity of the mechanical mounting and the measurement speed makes this new method very efficient and competitive with regards to the other commercial solutions.