For Emissive applications

MURA MVP is useful to analyze light emission of displays at pixel level. All the defects related to the pixel structure can be detected and quantified (homogeneity within pixel, punctual defects, alignment defects...). The dispersion at pixel level in terms of color and luminance can be quantified.

For Reflective applications

With optional integrated RGB illumination, reflective properties can be checked at pixel level. The structure and homogeneity of the diffusing mirror generally used in these devices can, for example, be observed directly . Also micrometric structures of optical components like, for example, BEF films can be visualized and quantified.

Reflective pixels of one Ipod display: the three types of pixels are clearly visible

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