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ELDIM at SID Display Week 2017

May 31, 2017

Written By


Thank you for visiting our booth and meeting us at Display Week 2017, held in Los Angeles Convention Center, California USA. We appreciated the opportunity to talk with you and present you ELDIM products.

Our ELDIM team was there to present you our VCProbe system, ultra-fast viewing angle for all your measurement. As well as the new multiplexing method which has been developed by our R&D team. This is only one example of the capabilities of our company. 
We enjoyed many inspiring and pleasant conversation about display metrology at this show. It was a successful event, and we would like to thank you again for your interest in our product, we hope that you enjoyed the exhibition.

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