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ELDIM participation - Display Week 2018

May 31, 2018


Thank you for visiting us at our booth, we appreciated the opportunity we had to meet you, and present you our products. This year again the Display Week show was held in the Los Angeles Convention Center in California, USA.



Our team was here to answer your questions and show you live demonstration of the XScope equipment for Microscopic Imaging and the VCProbe for Viewing angle measurement.

We had the pleasure to have many discussions on the optical metrology field. We hope that you enjoyed the exhibition and the time you spent in our booth.

Thanks for your interest !





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