February 11, 2019
We hope that you had a good time, enjoyed the show and the different conferences.
Thank you for visiting us at our booth, we were glad to present you the new ELDIM Systems VCProbe-NIR and OFScope-NIR. Two news products dedicated to characterization of NIR sources.
Our team was there to show you a live demonstration of the new system VCProbe-NIR, ideal to measure small aperture NIR sources.
We appreciated the opportunity we had to meet you, we had the pleasure to have many discussions. Feel free to contact us for more information.
Thanks for your interest !
Conferences & Exhibitions