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METHOD:PUBLISH
BEGIN:VEVENT
DTSTAMP:20120208T052054Z
CREATED:20070308T091110Z
UID:ATEvent-56f181d3d12d576373f6b6810a1980d7
SEQUENCE:0
LAST-MODIFIED:20070308T091145Z
SUMMARY:SPIE European Symposium on Optical Metrology
DTSTART:20070618T090000Z
DTEND:20070622T170000Z
DESCRIPTION:Learn about recent advances in using optical technologies to preserve our shared cultural heritage. Find out about new approaches that push optical principles of measurement and testing in the micro- and nanoscales to the forefront of optical metrology. 
LOCATION:International Congress Ctr., Munich, Germany
CATEGORIES:Convention
CLASS:PUBLIC
PRIORITY:3
TRANSP:OPAQUE
END:VEVENT
END:VCALENDAR